Forskjell mellom versjoner av «Atomic Force Microscopy»
| Linje 10: | Linje 10: | ||
==Contact mode== |
==Contact mode== |
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| − | In the contact region of the potential energy curve, repulsive forces dominate. Two |
+ | In the contact region of the potential energy curve, repulsive forces dominate. Two sub-modes: Set height constant and measure repulsive force or set force constant and measure height. |
==Tapping mode== |
==Tapping mode== |
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Revisjonen fra 23. mai 2009 kl. 19:19
Fun facts
High vacuum is not necessary. Piezoelectric position control system. The cantilever: V-shaped or single beam. V-shaped: high deflection sensitivity, not sensitive to torque. Single beam: vice-versa. Material used: diamond, tungsten, silicon. Artifacts: drift, non-linear hysterisis of piezoelectric.
Modes of operation
It is the displacement of the probe tip at the end of the cantilever that is measured.
Contact mode
In the contact region of the potential energy curve, repulsive forces dominate. Two sub-modes: Set height constant and measure repulsive force or set force constant and measure height.
Tapping mode
In the semi-contact region of the potential energy curve.
Non-contact mode
In the non-contact region of the potential energy curve, attractive forces dominate and are measured. What is observed is a an increase in the amplitude of the oscillations of the vibrating probe, translated into a change in attractive forces.
