Forskjell mellom versjoner av «Surface Probe Microscopy»

Revisjonen fra 23. mai 2009 kl. 19:03

En overkategori for AFM, STM og andre overflateprobebaserte mikroskop.

Surface forces

Three regions can be distinguished on the potential energy curve of to solid surfaces brought into contact. For larger distances, the non-contact mode, where the attractive forces dominate. These are for example caused by the Coulombic electrostatic forces, if the surfaces are of differernt charge. At distances smaller than the distance at which the potential enrgy is zero, one can define the contact mode. The repulsive forces are dominating and the attractive ones negligible. These are caused by steric hindrance, or the Debye/diffuse double layers for example. In between these two regions there is the semi-contact region.

Resolution

The probe tip radius limits the resolution of the image and it will be at least one order of magnitude bigger than the atom spacings. But it can still give atomic resolution.

Lenker

1. AFM
2. STM

Scaning probe microscopy is a field where microstructural information can be obtained by bringing a sharp, needle-shaped solid probe into close proximity to the surface we want to study. This method can give information about the surface structure and surface properties.